characterization of Roughness and Orientation of crystal with STM, AFM and optic methods
- From: "optoeletronic" <amire.seyedfaraji@xxxxxxxxx>
- Date: 14 Jul 2005 00:37:56 -0700
hi
I need some refrence about "characterization of Roughness and
Orientation of crystal with STM, AFM,XRD and optic methods" with some
details.
please help me.
thanks.
.
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